X-Tek Hawk X-ray Inspection

X-Tek Hawk X-ray Inspection

Hawk



• Purpose built for volume inspection in a production environment, either in semiconductor packaging or PCB assembly • Sample scan area of up to 350x530mm, the cabinet can accommodate large samples or trays of components • Has the same self-contained design and shelving as the Compact, however it is available with a wider range of source and imaging configuration to suit specific applications • 2 or 5µm Focal spot transmission target x-ray source, 25–160kV, 0–500µA (non-continuous) 10Watt (5µm) or 20Watt (2µm) • 5kg Capacity 3 axis fully programmable manipulator, 2kg capacity tilt and rotate • Attachment gives 5 fully programmable axes • Maximum scan area 350x530mm (310x500mm with tilt and rotate attachment) • Geometric magnification up to 2400X • System magnification up to 6000X • Feature recognition down to 1 micron • External cabinet 1060x1350x1955mm (LxDxH) Contact sales office for more information Tel 02380 650065